SPONTANEOUS DESORPTION - A SECONDARY ION PROCESS

被引：5

作者：

SCHOPPMANN, C ^{[1
]}

BRANDL, D ^{[1
]}

VOIT, H ^{[1
]}

机构：

[1] UNIV ERLANGEN NURNBERG,INST PHYS,W-8520 ERLANGEN,GERMANY

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1993年 / 124卷 / 01期

关键词：

TIME OF FLIGHT; SPONTANEOUS DESORPTION; DESORPTION MECHANISM;

D O I：

10.1016/0168-1176(93)85022-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

It is shown that kiloelectronvolt ion bombardment of a sample frequently causes electrons and/or H- ions to be sputtered simultaneously with a massive negative ion. This result is in accordance with an interpretation of the spontaneous desorption (SD) of negative ions in terms of a multistep process, the last step of which being a sputter process. It is also shown that the correlated emission of a low-mass and a massive positive ion is rather unlikely. This explains why SD spectra of positive ions are difficult to obtain with a time-of-flight mass spectrometer compared with spectra for negative ions.

引用

页码：79 / 83

页数：5