DEGRADATION OF OPERATIONAL-AMPLIFIERS BY ELECTRON-BEAM IRRADIATION

被引：2

|

作者：

HAYAMA, K ^{[1
]}

TOKUYAMA, J ^{[1
]}

OHYAMA, H ^{[1
]}

机构：

[1] KUMAMOTO NATL COLL TECHNOL,DEPT ELECTR ENGN,KUMAMOTO 86111,JAPAN

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1992年 / 129卷 / 02期

关键词：

D O I：

10.1002/pssa.2211290242

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

收藏

页码：K143 / K145

页数：3

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