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- [1] A VERY NARROW RESONANCE IN O-18(P,ALPHA) N-15 NEAR 150 KEV - APPLICATION TO ISOTOPIC TRACING .2. HIGH-RESOLUTION DEPTH PROFILING OF O-18 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 66 (1-2): : 1 - 10
- [2] A NEW MEASUREMENT OF THE 429 KEV N-15(P, ALPHA-GAMMA)C-12 RESONANCE - APPLICATIONS OF THE VERY NARROW WIDTH FOUND TO N-15 AND H-1 DEPTH LOCATION .1. RESONANCE WIDTH MEASUREMENT NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 159 - 164
- [3] MEASUREMENT OF OXYGEN-18 CONCENTRATION PROFILES NEAR-SURFACE VIA O-18(P,ALPHA)N-15 RESONANCE REACTION VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1975, 30 (177-): : 130 - 132
- [5] A NEW MEASUREMENT OF THE 429 KEV N-15(P,ALPHA-GAMMA) C-12 RESONANCE - APPLICATIONS OF THE VERY NARROW WIDTH FOUND TO N-15 AND H-1 DEPTH LOCATION .2. APPLICATIONS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 14 (02): : 226 - 233
- [6] Silicon isotopic tracing with the 29Si(p, γ) narrow resonance near 415 keV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 161 : 441 - 445
- [9] TOTAL CROSS SECTIONS OF THE O-18(P,ALPHA)N-15 REACTION AND O-18(P,N)F-18 REACTION PHYSICAL REVIEW, 1960, 118 (02): : 495 - 498