ELECTRON-BEAM DAMAGE - APPLICATIONS TO BUBBLE DEVICES

被引:0
|
作者
CLEGG, WW [1 ]
HARRIS, RA [1 ]
PICKARD, RM [1 ]
HARDY, CJ [1 ]
GOURLEY, SF [1 ]
机构
[1] UNIV MANCHESTER,ELECT ENGN LABS,MANCHESTER,LANCASHIRE,ENGLAND
关键词
D O I
10.1109/TMAG.1972.1067377
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:465 / &
相关论文
共 50 条
  • [1] ELECTRON-BEAM PROCESSED SAW DEVICES FOR SENSOR APPLICATIONS
    Loschonsky, Marc
    Eisele, David
    Masson, Jeremy
    Alzuaga, Sebastien
    Dadgar, Armin
    Ballandras, Sylvain
    Reindl, Leonhard
    [J]. 2009 6TH INTERNATIONAL MULTI-CONFERENCE ON SYSTEMS, SIGNALS AND DEVICES, VOLS 1 AND 2, 2009, : 947 - +
  • [2] Fabrication of SiGe quantum devices by electron-beam induced damage
    Ryan, JM
    Broers, AN
    Paul, DJ
    Pepper, M
    Whall, TE
    Fernandez, JM
    Joyce, BA
    [J]. SUPERLATTICES AND MICROSTRUCTURES, 1997, 21 (01) : 29 - 36
  • [3] THE MEASUREMENT OF ELECTRON-BEAM DAMAGE AND ITS APPLICATIONS TO THE STUDY OF POLYMERS
    VESELY, D
    LINDBERG, H
    [J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (68): : 7 - 10
  • [4] APPLICATIONS OF ELECTRON-BEAM WELDING
    BURNS, TE
    [J]. METAL CONSTRUCTION, 1975, 7 (06): : 333 - 337
  • [5] SCANNING ELECTRON-BEAM PROCESSING OF DEVICES
    MCMAHON, RA
    SPEIGHT, JD
    AHMED, H
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (08) : C364 - C364
  • [6] THE ROLE OF ELECTRON-BEAM IN DISPLAY DEVICES
    KONOSU, O
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 363 (1-2): : 330 - 336
  • [7] ELECTRON-BEAM DAMAGE IN CATHODOCHROMIC SODALITE
    BHALLA, RJRS
    [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (09) : 3703 - 3709
  • [8] ELECTRON-BEAM DAMAGE IN AUGER-ELECTRON SPECTROSCOPY
    PANTANO, CG
    MADEY, TE
    [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 115 - 141
  • [9] ELECTRON-BEAM TECHNIQUES FOR MAGNETIC BUBBLE DEVICE FABRICATION
    HARRIS, RA
    CLEGG, WW
    PICKARD, RM
    GOURLEY, SF
    HARDY, CJ
    [J]. RADIO AND ELECTRONIC ENGINEER, 1973, 43 (07): : 430 - 434
  • [10] ELECTRON-BEAM ANNEALING OF ION-IMPLANTATION DAMAGE IN INTEGRATED-CIRCUIT DEVICES
    KAMINS, TI
    ROSE, PH
    [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (03) : 1308 - 1311