ISSUES IN THE TEST OF ARTIFICIAL NEURAL NETWORKS

被引：1
|
作者：
WARKOWSKI, F
LEENSTRA, J
NIJHUIS, J
SPAANENBURG, L
机构：
来源：
PROCEEDINGS - IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN : VLSI IN COMPUTERS & PROCESSORS | 1989年
关键词：
D O I：
10.1109/ICCD.1989.63414
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：487 / 490
页数：4
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