STUDY OF AU SURFACES BY SCANNING TUNNELLING MICROSCOPY

被引：29

作者：

KUK, Y ^{[1
]}

SILVERMAN, PJ ^{[1
]}

CHUA, FM ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01407.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：449 / 457

页数：9

共 50 条

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