Field distribution and graphical ray tracing in electron optical systems.

被引：0

作者：

Jacob, L ^{[1
]}

机构：

[1] Gen Elect Co Ltd, Res Labs, Wembley, England

来源：

PHILOSOPHICAL MAGAZINE | 1938年 / 26卷 / 176期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：570 / 601

页数：32

共 50 条

[1] WAVE TRACING FOR OPTICAL SYSTEMS.
Byckling, Eero
Friberg, Ari
Optik (Jena), 1975, 42 (02): : 147 - 154
[2] On the equation to the axial potential distribution in electron optical systems.
Jacob, L
PHILOSOPHICAL MAGAZINE, 1938, 26 (176): : 601 - 609
[3] CURRENT-DENSITY DISTRIBUTION IN ELECTRON-OPTICAL SYSTEMS.
Ovsyannikova, L.P.
Shpak, E.V.
Yavor, S.Ya.
Soviet Physics, Technical Physics (English translation of Zhurnal Tekhnicheskoi Fiziki), 1975, 20 (11): : 1507 - 1511
[4] The distribution of light in optical systems.
Hardy, AC
JOURNAL OF THE FRANKLIN INSTITUTE, 1929, 208 : 773 - 791
[5] A rapid method for tracing rays through optical systems.
Moffitt, GW
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1925, 11 (01): : 16 - 16
[6] ELECTRON OPTICAL RAY TRACING IN CATHODE LENSES
VINE, J
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (07) : 544 - &
[7] TECHNICAL ASSESSMENT OF ELECTRON OPTICAL SYSTEMS.
Rigsbee, J.Michael
Journal of Metals, 1981, 33 (03): : 13 - 19
[8] Ray tracing Gaussian beam optical systems
Menard, Kenneth A.
OPTICAL ENGINEERING, 2024, 63 (07)
[9] GRAPHICAL RAY TRACING FOR CONIC SURFACES
CORNEJORODRIGUEZ, A
DAVILA, AC
APPLIED OPTICS, 1979, 18 (18): : 3075 - 3076
[10] Ray tracing the Wigner distribution function for optical simulations
Mout, Marco
Wick, Michael
Bociort, Florian
Petschulat, Joerg
Urbach, Paul
OPTICAL ENGINEERING, 2018, 57 (01)