IMAGE-PROCESSING ALGORITHMS FOR THE ANALYSIS OF PHASE-SHIFTED SPECKLE INTERFERENCE PATTERNS

被引:70
|
作者
VROOMAN, HA
MAAS, AAM
机构
[1] Delft University of Technology, Department of Applied Physics, Delft, GA, NL-2600
来源
APPLIED OPTICS | 1991年 / 30卷 / 13期
关键词
SPECKLE INTERFEROMETRY; IMAGE PROCESSING; STRAIN ANALYSIS; SURFACE METROLOGY;
D O I
10.1364/AO.30.001636
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A sequence of image processing algorithms for the analysis of interference patterns generated by a phase-shifting speckle interferometer is discussed. The goal is the accurate determination of displacement and strain components at the surface of an object. The phase change related to the displacement is accurately calculated from eight digitized interference patterns using a phase-shifting algorithm. Digital image processing algorithms have been developed for phase unwrapping, phase phase restoration, and phase fitting. During the processing steps a binary mask is used to solve the problem of invalid areas. Experimental results for the strain components at the surface of a simple object demonstrate a repeatability of 0.3-mu-strain rms.
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页码:1636 / 1641
页数:6
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