ESTIMATION OF RELIABILITY IN MULTICOMPONENT STRESS STRENGTH MODEL FOLLOWING A BURR DISTRIBUTION

被引:15
|
作者
PANDEY, M [1 ]
UDDIN, MB [1 ]
机构
[1] BANARAS HINDU UNIV,DEPT STAT,VARANASI 221005,UTTAR PRADESH,INDIA
来源
MICROELECTRONICS AND RELIABILITY | 1991年 / 31卷 / 01期
关键词
D O I
10.1016/0026-2714(91)90340-D
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper draws inferences about the reliability in a multi-component stress-strength system when both stress and strength are independently identically distributed (idd) Burr random variables. We consider both maximum likelihood and Bayes estimators of the system reliability. The two estimators are compared numerically by obtaining empirical efficiencies with respect to the maximum likelihood estimator (MLE) by generating 1000 random samples by a Monte Carlo simulation. It is found that the Bayes estimators are better than the corresponding MLEs for small samples (n(i) less-than-or-equal-to 7; i = 1, 2). Moreover, the robustness of the Bayes estimators to the change of the prior parameters is also considered.
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页码:21 / 25
页数:5
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