CHARACTERIZATION OF P4SE3 BY X-RAY POWDER DIFFRACTION AND RAMAN SPECTROSCOPY

被引:9
|
作者
MARONI, VA
SCHABLASKE, RV
机构
来源
关键词
D O I
10.1016/0022-1902(71)80090-8
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
引用
收藏
页码:3182 / +
页数:1
相关论文
共 50 条
  • [1] Characterisation of LaGdO3 by X-ray powder diffraction and Raman spectroscopy
    Tompsett, GA
    Phillips, RJ
    Sammes, NM
    Cartner, AM
    SOLID STATE COMMUNICATIONS, 1998, 108 (09) : 655 - 660
  • [2] A NEW POLYMORPH OF TETRAPHOSPHORUS TRISELENIDE, ALPHA'-P4SE3 - AN X-RAY, RAMAN, AND XPS STUDY OF THE NORMAL CRYSTALLINE PHASES AND A DSC STUDY OF THE CRYSTALLINE AND THE ORIENTATIONALLY DISORDERED PHASES OF P4SE3
    ROLLO, JR
    BURNS, GR
    ROBINSON, WT
    CLARK, RJH
    DAWES, HM
    HURSTHOUSE, MB
    INORGANIC CHEMISTRY, 1990, 29 (16) : 2889 - 2894
  • [3] Characterization of New Cocrystals by Raman Spectroscopy, Powder X-ray Diffraction, Differential Scanning Calorimetry, and Transmission Raman Spectroscopy
    Elbagerma, M. A.
    Edwards, H. G. M.
    Munshi, T.
    Hargreaves, M. D.
    Matousek, Pavel
    Scowen, I. J.
    CRYSTAL GROWTH & DESIGN, 2010, 10 (05) : 2360 - 2371
  • [4] Characterization of ytterbium-yttrium mixed oxides using Raman spectroscopy and x-ray powder diffraction
    Panitz, JC
    JOURNAL OF RAMAN SPECTROSCOPY, 1999, 30 (11) : 1035 - 1042
  • [5] Characterization of δ-KZnPO4 by X-ray powder diffraction
    Self, Peter G.
    Raven, Mark D.
    POWDER DIFFRACTION, 2021, 36 (04) : 257 - 261
  • [6] X-Ray diffraction and Raman spectra of As4S3Se3-Sn glasses
    Iaseniuc, O. V.
    Iovu, M. S.
    Volodina, G. F.
    Enachescu, M.
    Dinescu, D.
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2015, 17 (7-8): : 980 - 984
  • [7] X-ray Powder Diffraction Characterization of Pyrope
    王冠鑫
    龚国洪
    Chinese Journal of Geochemistry(English Language Edition), 1990, (03) : 284 - 288
  • [8] X-ray Powder Diffraction Characterization of Nanoparticles
    Giannini, Cinzia
    Guagliardi, Antonietta
    Zanchet, Daniela
    Cervellino, Antonio
    Ladisa, Massimo
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2005, 61 : C405 - C405
  • [9] Particle Characterization by X-ray Powder Diffraction
    Herrmann, Michael
    Foerter-Barth, Ulrich
    Kempa, Paul Bernd
    Kroeber, Hartmut
    CHEMICAL ENGINEERING & TECHNOLOGY, 2009, 32 (07) : 1067 - 1072
  • [10] Product characterization by X-ray powder diffraction
    McCusker, LB
    MICROPOROUS AND MESOPOROUS MATERIALS, 1998, 22 (4-6) : 527 - 529