ANALYSIS OF THE SI(111)5 X 5-2 X-1 PHASE-BOUNDARY

被引：4
|
作者：
HANEMAN, D
机构：
[1] Sch. of Phys., New South Wales Univ., Kensington, NSW
来源：
JOURNAL OF PHYSICS-CONDENSED MATTER | 1993年 / 5卷 / 18期
关键词：
D O I：
10.1088/0953-8984/5/18/008
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Experimental scanning tunnelling microscopy data for the Si(111)5 x 5 - 2 x 1 phase boundary are analysed with reference to the structure of the 2 x 1 surface. The height change data are subject to significant correction factors, making interpretation difficult due to the small theoretical differences involved. The theoretical lateral differences are much larger, being 3.3 angstrom, and these are analysed.
引用
收藏
页码：2869 / 2874
页数：6
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