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IMAGING OF ALUMINUM BY FIELD-ION MICROSCOPY
被引:7
|
作者
:
ZINGG, W
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS ALUMINIUM LTD,DEPT RES & DEV,CH-8212 NEUHAUSEN AM RHEI,SWITZERLAND
SWISS ALUMINIUM LTD,DEPT RES & DEV,CH-8212 NEUHAUSEN AM RHEI,SWITZERLAND
ZINGG, W
[
1
]
WARLIMONT, H
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS ALUMINIUM LTD,DEPT RES & DEV,CH-8212 NEUHAUSEN AM RHEI,SWITZERLAND
SWISS ALUMINIUM LTD,DEPT RES & DEV,CH-8212 NEUHAUSEN AM RHEI,SWITZERLAND
WARLIMONT, H
[
1
]
机构
:
[1]
SWISS ALUMINIUM LTD,DEPT RES & DEV,CH-8212 NEUHAUSEN AM RHEI,SWITZERLAND
来源
:
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
|
1978年
/ 45卷
/ 01期
关键词
:
D O I
:
10.1002/pssa.2210450113
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:117 / 122
页数:6
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