Rapid and accurate measurement of line positions on x-ray diffraction films with the aid of a cathode-ray oscillograph

被引：1
|
作者：
Tatel, H [1 ]
Hultgren, R [1 ]
机构：
[1] Harvard Univ, Grad Sch Engn, Cambridge, MA USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1938年 / 9卷 / 02期
关键词：
D O I：
10.1063/1.1752391
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：47 / 50
页数：4
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