VERIFICATION OF RELIABILITY TECHNICAL DEVICES THROUGH RESOLVING PROBABILITY OF FAILURE AND FAILURE

被引:1
|
作者
Akhmetov, J. W. [1 ]
Seitova, S. M. [1 ]
Toibazarov, D. B. [1 ]
Kadyrbayeva, G. T. [1 ]
Dauletkulova, A. U. [2 ]
Issayeva, G. B. [3 ]
机构
[1] Zhetysu State Univ, Taldykorgan, Kazakhstan
[2] Kazakh State Womens Teacher Training Univ, Alma Ata, Kazakhstan
[3] Caspian Univ, Alma Ata, Kazakhstan
关键词
failure; probability; technical devices; information system; reliability;
D O I
10.32014/2018.2518-1726.7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
This article describes the basic concepts and definitions of reliability theory and its applications to problems of probability theory. Probability theory makes it possible to take into account the random nature of events and processes occurring in the system, to form the mathematical foundations of the theory of reliability. The problems on the probability of failure-free operation of the element are considered.One of the main tasks solved in the course of operation and maintenance of technical devices is to ensure their reliable operation. The importance of this problem is due to the complexity of modern technical devices and high values of operating loads (temperature, pressure, humidity, etc.). Reliability refers to the ability of technical devices to perform specified functions, maintaining their performance within the specified limits for the required period of time or the required operating time in certain operating conditions.Reliability as a qualitative characteristic has always been taken into account when solving various issues of operation and maintenance.
引用
收藏
页码:49 / 61
页数:13
相关论文
共 50 条
  • [1] VERIFICATION OF RELIABILITY TECHNICAL DEVICES THROUGH RESOLVING PROBABILITY OF FAILURE AND FAILURE
    Akhmetov, J. W.
    Seitova, S. M.
    Toibazarov, D. B.
    Kadyrbayeva, G. T.
    Dauletkulova, A. U.
    Issayeva, G. B.
    NEWS OF THE NATIONAL ACADEMY OF SCIENCES OF THE REPUBLIC OF KAZAKHSTAN-SERIES PHYSICO-MATHEMATICAL, 2018, 4 (320): : 72 - 84
  • [2] RELIABILITY INDEX AND FAILURE PROBABILITY
    HASOFER, AM
    JOURNAL OF STRUCTURAL MECHANICS, 1974, 3 (01): : 25 - 27
  • [3] Reliability and failure probability of structures
    Jost, AR
    Thierauf, G
    DEVELOPMENTS IN COMPUTATIONAL MECHANICS WITH HIGH PERFORMANCE COMPUTING, 1999, : 235 - 243
  • [4] Reliability and failure of electronic materials and devices
    Ohring, M
    PHYSICS AND TECHNOLOGY OF THIN FILMS, 2004, : 171 - 179
  • [5] Average Probability of Failure of Aperiodically Operated Devices
    Lamar, Krisztian
    Neszveda, Jozsef
    ACTA POLYTECHNICA HUNGARICA, 2013, 10 (08) : 153 - 167
  • [6] Building-in reliability through failure analysis in sub-micron devices
    Radhakrishnan, MK
    Chih-Hang, T
    Natarajan, M
    PROCEEDING OF THE TENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOLS I AND II, 2000, 3975 : 784 - 789
  • [7] Reliability and failure behavior model of optoelectronic devices
    Tang, Ning
    Chen, Ying
    Yuan, ZengHui
    2016 INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING, MANAGEMENT SCIENCE AND APPLICATIONS (ICIMSA), 2016,
  • [8] Reliability of electronic devices: Failure mechanisms and testing
    Sikula, Josef
    Sedlakova, Vlasta
    Tacano, Munecazu
    Zednicek, Tomas
    RELIABILITY, RISK AND SAFETY: THEORY AND APPLICATIONS VOLS 1-3, 2010, : 1925 - 1936
  • [9] Reliability of electron devices, failure physics and analysis
    Balk, L. J.
    Gerling, W. H.
    Wolfgang, E.
    MICROELECTRONICS RELIABILITY, 2006, 46 (9-11) : 1401 - 1402
  • [10] Reliability of buried pipeline using a theory of probability of failure
    Lee, OS
    Kim, DH
    Choi, SS
    ADVANCES IN SAFETY AND STRUCTURAL INTEGRITY 2005, 2006, 110 : 221 - 230