COMPUTER-AIDED MANUFACTURING OF ADVANCED MICROWAVE MODULES

被引：0
|
作者：
PAVIO, AM
PAVIO, JS
CHAPMAN, JE
BOGGAN, GH
机构：
[1] Texas Instruments Incorporated, Dallas, Texas, 75265
来源：
INTERNATIONAL JOURNAL OF MICROWAVE AND MILLIMETER-WAVE COMPUTER-AIDED ENGINEERING | 1991年 / 1卷 / 01期
关键词：
D O I：
10.1002/mmce.4570010109
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
The application of computer‐aided manufacturing (CAM) techniques to the assembly and test of a low‐cost, high‐volume X‐band Radar T/R module will be investigated by highlighting the differences between low frequency and microwave CAM methods, focusing on the difficulties of automated testing, evaluation, and circuit tuning. The problems encountered when implementing high‐precision automated assembly and test methods, which include wire‐bonding, soldering, piece‐part placement, thin wafer GaAs probing, and a novel implementation of a microwave circuit laser‐tuning technique will also be discussed. These CAM techniques, combined with integrated MMIC technology, are then used to illustrate a manufacturing philosophy targeted toward high‐volume microwave module production. Copyright © 1991 Wiley Periodicals, Inc., A Wiley Company
引用
收藏
页码：90 / 111
页数：22
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