USE OF INTERFEROMETER TECHNIQUES TO MEASURE TRANSDUCER SURFACE BEHAVIOR

被引：0
|
作者：
BRUSTMAN, FH
机构：
来源：
SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS JOURNAL | 1967年 / 5卷 / 03期
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D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
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页码：104 / &
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