RELOCATION OF ASTIGMATISM-COMPENSATOR CONTROLS ON RCA-EMU 3 ELECTRON MICROSCOPES

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LLOYD, BJ

WANKO, T

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JOURNAL OF APPLIED PHYSICS | 1963年 / 34卷 / 08期

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O59 [应用物理学];

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页码：2512 / &

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[1] RELOCATION OF ASTIGMATISM COMPENSATOR CONTROLS ON RCA-EMU-3 ELECTRON MICROSCOPES
LLOYD, BJ
REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (11): : 1607 - &
[2] NEW COMBINATION OF APERTURES FOR USE IN RCA-EMU 3 ELECTRON MICROSCOPES
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RICHTER, GW
REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (10): : 834 - 835
[3] IMPROVING PRECISION OF POWDER DIFFRACTION WITH THE RCA-EMU ELECTRON MICROSCOPE
JAFFE, MS
JOURNAL OF APPLIED PHYSICS, 1951, 22 (01) : 112 - 112
[4] ROTATION OF IMAGE AND SELECTED AREA DIFFRACTION PATTERN IN RCA-EMU 3 ELECTRON MICROSCOPE
BALTZ, A
REVIEW OF SCIENTIFIC INSTRUMENTS, 1962, 33 (02): : 246 - &
[5] EXTENSIBLE AREA SPECIMEN HOLDER FOR RCA-EMU MODELS ELECTRON MICROSCOPE
BORASKY, R
JOURNAL OF APPLIED PHYSICS, 1954, 25 (11) : 1454 - 1454
[6] A NEW EXTERNAL OBJECTIVE APERTURE CENTERING AND INTERCHANGING DEVICE FOR THE RCA-EMU ELECTRON MICROSCOPE
BISHOP, FW
REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (04): : 269 - 271
[7] THE OPTICAL SYSTEM OF THE RCA EMU-3A ELECTRON MICROSCOPE
REISNER, JH
JOURNAL OF APPLIED PHYSICS, 1954, 25 (11) : 1453 - 1453
[8] MEASUREMENT OF CONTRAST DUE TO ELECTRON SCATTERING WITH THE RCA EMU3
HALL, CE
INOUE, T
JOURNAL OF APPLIED PHYSICS, 1957, 28 (11) : 1370 - 1370
[9] LORENTZ ATTACHMENT FOR SPECIMEN CHAMBER OF RCA EMU-3 ELECTRON MICROSCOPE
BROWN, JL
JOURNAL OF APPLIED PHYSICS, 1966, 37 (10) : 3936 - &
[10] A PLASTIC HANDLING TOOL FOR RCA EMU-3 ELECTRON MICROSCOPE SPECIMEN HOLDERS
CHUBB, GT
ELLWANGER, PW
STAIN TECHNOLOGY, 1967, 42 (04): : 213 - +