TRANSMISSION ELECTRON-MICROSCOPY AND TRANSMISSION ELECTRON-DIFFRACTION STUDIES OF ATOMIC ORDERING IN GROUP-III-V COMPOUND SEMICONDUCTOR ALLOYS

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NORMAN, AG

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EVALUATION OF ADVANCED SEMICONDUCTOR MATERIALS BY ELECTRON MICROSCOPY | 1989年 / 203卷

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TH742 [显微镜];

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页码：233 / 253

页数：21

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