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- [4] CONCENTRATION AND TEMPERATURE-DEPENDENCE OF SHORT-RANGE ORDER IN NI-TA SOLID-SOLUTIONS USING THE X-RAY-DIFFRACTION METHODACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (SEP): : 744 - 745KHWAJA, FAALAM, A
- [5] X-RAY-DIFFRACTION STUDY OF LATTICE-PARAMETERS FOR LAYERED COMPOUNDS M(X)TAS(2) (M=TL OR IN)JOURNAL OF PHYSICS-CONDENSED MATTER, 1995, 7 (24) : 4625 - 4628TAKEDA, TYOKOZEKI, SYAMAMOTO, KOHSHIMA, K
- [6] ON THE STRUCTURE AND HOMOGENEITY OF SOLID-SOLUTIONS - THE LIMITS OF CONVENTIONAL X-RAY-DIFFRACTIONPHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1995, 72 (03): : 813 - 828MICHAELSEN, C
- [7] X-RAY-DIFFRACTION STUDIES OF YBTE-TMTE SOLID-SOLUTIONSZHURNAL NEORGANICHESKOI KHIMII, 1977, 22 (04): : 1124 - 1125ELISEEV, AARUKK, FABRIKOSOV, NKZINCHENKO, KAZEMLYANUKHINA, VM
- [8] SYNTHESIS AND X-RAY-DIFFRACTION STUDY OF POTASSIUM AND COBALT DOUBLE ACETATES AND SOLID-SOLUTIONSZHURNAL NEORGANICHESKOI KHIMII, 1981, 26 (04): : 980 - 984MAKHONINA, NVDRUZHININ, IGKOZHANOVA, TS
- [9] THERMAL X-RAY-DIFFRACTION STUDY OF SOLID-SOLUTIONS WITH THE BETA-QUARTZ STRUCTUREINORGANIC MATERIALS, 1992, 28 (02) : 301 - 307ARTYUKH, EPASTAKHOV, VVZHILIN, AAFILATOV, SKCHUVAEVA, TI
- [10] A SIMPLE METHOD FOR THE DETERMINATION OF LATTICE-PARAMETERS FROM POWDER X-RAY-DIFFRACTION DATAMATERIALS TRANSACTIONS JIM, 1989, 30 (07): : 474 - 479TSAI, DSCHIN, TSHSU, SEHUNG, MP