SPATIALLY RESOLVED ELECTRON ENERGY-LOSS SPECTROSCOPY OF MOS2 PLATELETS

被引：9
|
作者：
DISKO, MM
TREACY, MMJ
RICE, SB
CHIANELLI, RR
GLAND, JA
HALBERT, TR
RUPPERT, AF
机构：
[1] Exxon Research & Engineering Co,, Annandale, NJ, USA, Exxon Research & Engineering Co, Annandale, NJ, USA
来源：
ULTRAMICROSCOPY | 1987年 / 23卷 / 3-4期
关键词：
AIR-SENSITIVE MATERIALS - ELECTRON ENERGY LOSS SPECTROSCOPY - MOLYBDENUM SULFIDE PLATELETS;
D O I：
10.1016/0304-3991(87)90241-5
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
下载
收藏
页码：313 / 319
页数：7
相关论文
共 50 条
  • [1] Highly spatially resolved electron energy-loss spectroscopy in the bandgap regime of GaN
    Bangert, U
    Harvey, AJ
    Freundt, D
    Keyse, R
    JOURNAL OF MICROSCOPY-OXFORD, 1997, 188 : 237 - 242
  • [2] Plasmons in layered nanospheres and nanotubes investigated by spatially resolved electron energy-loss spectroscopy
    Kociak, M
    Henrard, L
    Stéphan, O
    Suenaga, K
    Colliex, C
    PHYSICAL REVIEW B, 2000, 61 (20) : 13936 - 13944
  • [3] Atomic column resolved electron energy-loss spectroscopy
    Duscher, G
    Browning, ND
    Pennycook, SJ
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1998, 166 (01): : 327 - 342
  • [4] Investigation of potassium-intercalated bulk MoS2 using transmission electron energy-loss spectroscopy
    Habenicht, Carsten
    Lubk, Axel
    Schuster, Roman
    Knupfer, Martin
    Buechner, Bernd
    PHYSICAL REVIEW B, 2020, 101 (15)
  • [5] Application of spatially resolved electron energy-loss spectroscopy to the quantitative analysis of semiconducting layer structures
    Walther, T
    Mader, W
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS, 1999, (164): : 121 - 128
  • [6] Local electronic structure of defects in GaN from spatially resolved electron energy-loss spectroscopy
    Natusch, MKH
    Botton, GA
    Humphreys, CJ
    GROWTH AND PROCESSING OF ELECTRONIC MATERIALS, 1998, : 30 - 36
  • [7] Evidence for charged defects in wurtzite GaN from spatially resolved electron energy-loss spectroscopy
    Natusch, MKH
    Botton, GA
    Humphreys, CJ
    ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2, 1998, : 391 - 392
  • [8] Local electronic structure of defects in GaN from spatially resolved electron energy-loss spectroscopy
    Natusch, MKH
    Botton, GA
    Broom, RF
    Brown, PD
    Tricker, DM
    Humphreys, CJ
    NITRIDE SEMICONDUCTORS, 1998, 482 : 763 - 768
  • [9] Time-resolved acquisition technique for spatially-resolved electron energy-loss spectroscopy by energy-filtering TEM
    Terada, S
    Aoyama, T
    Yano, F
    Mitsui, Y
    JOURNAL OF ELECTRON MICROSCOPY, 2002, 51 (05) : 291 - 296
  • [10] Spatially resolved electron energy-loss spectroscopy of the surface excitations on the insulating fine particle of aluminum oxide
    Abe, H
    Kurata, H
    Hojou, K
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 2000, 69 (05) : 1553 - 1557
12345