EFFECT OF ACID DIFFUSION ON PERFORMANCE IN POSITIVE DEEP-ULTRAVIOLET RESISTS

被引:78
|
作者
FEDYNYSHYN, TH
THACKERAY, JW
GEORGER, JH
DENISON, MD
机构
来源
关键词
D O I
10.1116/1.587569
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
下载
收藏
页码:3888 / 3894
页数:7
相关论文
共 50 条
  • [1] DETERMINATION OF ACID DIFFUSION IN CHEMICAL AMPLIFICATION POSITIVE DEEP ULTRAVIOLET RESISTS
    SCHLEGEL, L
    UENO, T
    HAYASHI, N
    IWAYANAGI, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 278 - 289
  • [2] PROCESSING OF DEEP-ULTRAVIOLET (UV) RESISTS
    VANPELT, P
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 275 : 150 - 154
  • [3] Reaction-diffusion modeling and simulations in positive deep ultraviolet resists
    Zuniga, M
    Neureuther, AR
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06): : 2957 - 2962
  • [4] MODELING SPRAY PUDDLE DISSOLUTION PROCESSES FOR DEEP-ULTRAVIOLET ACID-HARDENED RESISTS
    HUTCHINSON, JM
    DAS, S
    QIAN, QD
    GAW, HT
    OPTICAL ENGINEERING, 1993, 32 (10) : 2395 - 2402
  • [5] Time dependence of the reaction-diffusion simulation of the postexposure bake process of deep-ultraviolet resists
    Li, TL
    Ting, JH
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (01): : 79 - 80
  • [6] Polymer structure effect on dissolution characteristics and acid diffusion in chemically amplified deep ultraviolet resists
    Itani, T
    Yoshino, H
    Hashimoto, S
    Yamana, M
    Samoto, N
    Kasama, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (06): : 2541 - 2544
  • [7] DEVELOPMENT OF BILAYER RESISTS FOR DEEP-ULTRAVIOLET AND I-LINE APPLICATION
    MCKEAN, DR
    CLECAK, NJ
    RENALDO, AF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 3413 - 3417
  • [8] THE SILYLATION PROCESSES FOR POSITIVE AND NEGATIVE DEEP ULTRAVIOLET RESISTS
    SVIRIDOV, SM
    TIMEROV, MR
    VALIEV, KA
    VELIKOV, LV
    ZAROSLOV, DY
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06): : 1488 - 1492
  • [9] DETERMINATION OF ACID DIFFUSION IN CHEMICAL AMPLIFICATION POSITIVE DEEP-UV RESISTS
    SCHLEGEL, L
    UENO, T
    HAYASHI, N
    IWAYANAGI, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (11B): : 3132 - 3137
  • [10] Determination of acid diffusion in chemical amplification positive deep-UV resists
    Schlegel, Leo
    Ueno, Takumi
    Hayashi, Nobuaki
    Iwayanagi, Takao
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1991, 30 (11 B): : 3132 - 3137