MEASUREMENT OF OPTICAL NONLINEARITIES USING AN ELLIPTIC GAUSSIAN-BEAM

被引:10
|
作者
MIAN, SM
WICKSTED, JP
机构
[1] Department of Physics, Center for Laser Research, Oklahoma State University, Stillwater
关键词
D O I
10.1063/1.359236
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated optical nonlinearities using a beam that has a transverse elliptic Gaussian profile. The popular single-beam technique known as Z-scan complimented with optical limiting experiments are analyzed in this study. A geometric optics model including both nonlinear refraction and absorption is developed in the aberration-free approximation. We have found good agreement between theory and experimental data taken from a lead silicate glass where the elliptic beam had an eccentricity of about 0.98. © 1995 American Institute of Physics.
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页码:5434 / 5436
页数:3
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