BAYES ESTIMATION IN LIFE TESTING AND RELIABILITY - MULTIVARIATE CASE

被引：1

作者：

LWIN, T

机构：

[1] MONASH UNIV,DEPT MATH,CLAYTON,VICTORIA,AUSTRALIA

[2] INST ECON,DEPT STATISTICS,RANGOON,BURMA

来源：

MICROELECTRONICS AND RELIABILITY | 1974年 / 13卷 / 04期

关键词：

D O I：

10.1016/0026-2714(74)90105-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：267 / 276

页数：10

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