NEW METHOD FOR RELIABILITY OPTIMIZATION

被引：7
|
作者：
GOPAL, K [1 ]
AGGARWAL, KK [1 ]
GUPTA, JS [1 ]
机构：
[1] REG ENGN COLL,DEPT ELECTR & COMMUN ENGN,KURUKSHETRA 132119,HARYANA,INDIA
来源：
MICROELECTRONICS AND RELIABILITY | 1978年 / 17卷 / 06期
关键词：
D O I：
10.1016/0026-2714(78)90447-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：605 / 608
页数：4
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