TESTING CIRCUIT-BREAKERS BY SYNTHETIC METHODS

被引:0
|
作者
BRAUN, A
HUBER, H
机构
来源
BROWN BOVERI REVIEW | 1973年 / 60卷 / 04期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The test bay continues to play a vital part in the development of circuit-breakers. The ever increasing requirements as regards test power and the scope of tests and measurements have in recent years produced a flurry of activity in the field of test procedures. The necessary tests are laid down in national and international recommendations which themselves are continually being updated. The test circuits employed in Brown Boveri's high-power testing station are presented. These circuits allow terminal and short-line fault testing of circuit-breakers in accordance with the recommendations now in force. The behavior of the different types of breaker under various conditions on opening must be precisely analyzed so that economical test methods can be devised for development purposes.
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页码:185 / 190
页数:6
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