首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
STATIC RANDOM-ACCESS MEMORY WITH NORMALLY-OFF-TYPE SCHOTTKY-BARRIER FETS
被引:3
|
作者
:
SUZUKI, S
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
SUZUKI, S
[
1
]
NAGAHASHI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
NAGAHASHI, Y
[
1
]
TANAKA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
TANAKA, T
[
1
]
YAMADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
YAMADA, T
[
1
]
MUTA, H
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
MUTA, H
[
1
]
OKABAYASHI, H
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
OKABAYASHI, H
[
1
]
YAMADA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
YAMADA, K
[
1
]
机构
:
[1]
NIPPON ELECT CO LTD, CENT RES LABS, KAWASAKI, JAPAN
来源
:
IEEE JOURNAL OF SOLID-STATE CIRCUITS
|
1973年
/ SC 8卷
/ 05期
关键词
:
D O I
:
10.1109/JSSC.1973.1050412
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:326 / 332
页数:7
相关论文
共 50 条
[1]
STATIC RAM WITH NORMALLY-OFF-TYPE SCHOTTKY-BARRIER FETS
SUZUKI, S
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, PERIPHERAL EQUIPMENT LAB, TOKYO, JAPAN
SUZUKI, S
NAGAHASH.Y
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, PERIPHERAL EQUIPMENT LAB, TOKYO, JAPAN
NAGAHASH.Y
TANAKA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, PERIPHERAL EQUIPMENT LAB, TOKYO, JAPAN
TANAKA, T
YAMADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, PERIPHERAL EQUIPMENT LAB, TOKYO, JAPAN
YAMADA, T
MUTA, H
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, PERIPHERAL EQUIPMENT LAB, TOKYO, JAPAN
MUTA, H
OKABAYAS.H
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, PERIPHERAL EQUIPMENT LAB, TOKYO, JAPAN
OKABAYAS.H
YAMADA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD, CENT RES LABS, PERIPHERAL EQUIPMENT LAB, TOKYO, JAPAN
YAMADA, K
NEC RESEARCH & DEVELOPMENT,
1974,
(32):
: 19
-
25
[2]
MEMORY-CELL ARRAY WITH NORMALLY OFF-TYPE SCHOTTKY-BARRIER FETS
DRANGEID, KE
论文数:
0
引用数:
0
h-index:
0
DRANGEID, KE
MOSER, A
论文数:
0
引用数:
0
h-index:
0
MOSER, A
MOHR, TO
论文数:
0
引用数:
0
h-index:
0
MOHR, TO
BROOM, RF
论文数:
0
引用数:
0
h-index:
0
BROOM, RF
JUTZI, W
论文数:
0
引用数:
0
h-index:
0
JUTZI, W
SASSO, G
论文数:
0
引用数:
0
h-index:
0
SASSO, G
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1972,
SC 7
(04)
: 277
-
&
[3]
Schottky-Barrier Normally Off GaN/InAlN/AlN/GaN HEMT With Selectively Etched Access Region
Jurkovic, Michal
论文数:
0
引用数:
0
h-index:
0
机构:
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Jurkovic, Michal
Gregusova, Dagmar
论文数:
0
引用数:
0
h-index:
0
机构:
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Gregusova, Dagmar
Palankovski, Vassil
论文数:
0
引用数:
0
h-index:
0
机构:
TU Vienna, Adv Mat & Device Anal Grp, A-1040 Vienna, Austria
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Palankovski, Vassil
Hascik, Stefan
论文数:
0
引用数:
0
h-index:
0
机构:
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Hascik, Stefan
Blaho, Michal
论文数:
0
引用数:
0
h-index:
0
机构:
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Blaho, Michal
Cico, Karol
论文数:
0
引用数:
0
h-index:
0
机构:
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Cico, Karol
Froehlich, Karol
论文数:
0
引用数:
0
h-index:
0
机构:
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Froehlich, Karol
Carlin, Jean-Francois
论文数:
0
引用数:
0
h-index:
0
机构:
Ecole Polytech Fed Lausanne, Inst Quantum Elect & Photon, CH-1015 Lausanne, Switzerland
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Carlin, Jean-Francois
Grandjean, Nicolas
论文数:
0
引用数:
0
h-index:
0
机构:
Ecole Polytech Fed Lausanne, Inst Quantum Elect & Photon, CH-1015 Lausanne, Switzerland
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Grandjean, Nicolas
Kuzmik, Jan
论文数:
0
引用数:
0
h-index:
0
机构:
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
Kuzmik, Jan
IEEE ELECTRON DEVICE LETTERS,
2013,
34
(03)
: 432
-
434
[4]
TESTING METHOD FOR STATIC RANDOM-ACCESS MEMORY
MADHAVEN, R
论文数:
0
引用数:
0
h-index:
0
MADHAVEN, R
ELECTRONIC ENGINEERING,
1977,
49
(596):
: 22
-
22
[5]
Spin-transfer torque magnetoresistive random-access memory technologies for normally off computing (invited)
Ando, K.
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Ando, K.
Fujita, S.
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Kawasaki, Kanagawa 2128582, Japan
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Fujita, S.
Ito, J.
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Kawasaki, Kanagawa 2128582, Japan
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Ito, J.
Yuasa, S.
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Yuasa, S.
Suzuki, Y.
论文数:
0
引用数:
0
h-index:
0
机构:
Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Suzuki, Y.
Nakatani, Y.
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Electrocommun, Dept Commun Engn & Informat, Chofu, Tokyo 1828585, Japan
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Nakatani, Y.
Miyazaki, T.
论文数:
0
引用数:
0
h-index:
0
机构:
Tohoku Univ, WPI AIMR, Sendai, Miyagi 9808577, Japan
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Miyazaki, T.
Yoda, H.
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Kawasaki, Kanagawa 2128582, Japan
Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
Yoda, H.
JOURNAL OF APPLIED PHYSICS,
2014,
115
(17)
[6]
Normally-off type nonvolatile static random access memory with perpendicular spin torque transfer-magnetic random access memory cells and smallest number of transistors
Tanaka, Chika
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Tanaka, Chika
Abe, Keiko
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Abe, Keiko
Noguchi, Hiroki
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Noguchi, Hiroki
Nomura, Kumiko
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Nomura, Kumiko
Ikegami, Kazutaka
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Ikegami, Kazutaka
Fujita, Shinobu
论文数:
0
引用数:
0
h-index:
0
机构:
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Toshiba Co Ltd, Corp R&D Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
Fujita, Shinobu
JAPANESE JOURNAL OF APPLIED PHYSICS,
2014,
53
(04)
[7]
STATIC 4096-BIT BIPOLAR RANDOM-ACCESS MEMORY
HERNDON, WH
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD SEMICOND,MOUNTAIN VIEW,CA 94040
FAIRCHILD SEMICOND,MOUNTAIN VIEW,CA 94040
HERNDON, WH
HO, W
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD SEMICOND,MOUNTAIN VIEW,CA 94040
FAIRCHILD SEMICOND,MOUNTAIN VIEW,CA 94040
HO, W
RAMIREZ, R
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD SEMICOND,MOUNTAIN VIEW,CA 94040
FAIRCHILD SEMICOND,MOUNTAIN VIEW,CA 94040
RAMIREZ, R
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1977,
12
(05)
: 524
-
527
[8]
128Kb CMOS static random-access memory
Chu, J.L.,
1600,
(35):
[9]
HIGH-SPEED GAAS STATIC RANDOM-ACCESS MEMORY
BERT, G
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON EFCIS,GRENOBLE,FRANCE
THOMSON EFCIS,GRENOBLE,FRANCE
BERT, G
MORIN, JP
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON EFCIS,GRENOBLE,FRANCE
THOMSON EFCIS,GRENOBLE,FRANCE
MORIN, JP
NUZILLAT, G
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON EFCIS,GRENOBLE,FRANCE
THOMSON EFCIS,GRENOBLE,FRANCE
NUZILLAT, G
ARNODO, C
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON EFCIS,GRENOBLE,FRANCE
THOMSON EFCIS,GRENOBLE,FRANCE
ARNODO, C
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1982,
30
(07)
: 1014
-
1019
[10]
A 128KB-CMOS STATIC RANDOM-ACCESS MEMORY
CHU, JL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM General Technology Div, Essex Junction, VT
CHU, JL
TORABI, HR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM General Technology Div, Essex Junction, VT
TORABI, HR
TOWLER, FJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM General Technology Div, Essex Junction, VT
TOWLER, FJ
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1991,
35
(03)
: 321
-
329
←
1
2
3
4
5
→