Capacitive MEMS Accelerometer Based on Silicon-on-Insulator Technology: Design, Simulation and Radiation Affect

被引:0
|
作者
Sharaf, Abdelhameed E. [1 ]
机构
[1] Egyptian Atom Energy Author, Natl Ctr Radiat Res & Technol, Radiat Engn Dept, Cairo, Egypt
来源
关键词
Capacitive Sensor; MEMS; Silicon-On-Insulator; Finite Element Analysis; Radiation Effects on MEMS devices;
D O I
暂无
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
This work introduces the design, simulation and the radiation effects for an out of plane micromachined z-axis accelerometer based on the silicon-on-insulator technology. In this design, the response to acceleration is sensed capacitevely via four comb-finger capacitors. This scheme helps the implementation of the sensor by the bulk micromachining process. The simulation results shows a good z-axis sensitivity of 24.14(pm/g) and a total equivalent noise acceleration as small as 3.41(mu g/(Hz)(1/2)) and a minimum off-axis sensitivities of 0.15% and 0.3% in x- and y-directions respectively. The radiation sensitivity depends on the sensing or actuation principle, device design, and radiation-induced trapped charge in dielectrics.
引用
收藏
页码:231 / 241
页数:11
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