CARBON CLUSTER EMISSION FROM POLYMERS UNDER KILOELECTRONVOLT AND MEGAELECTRONVOLT ION-BOMBARDMENT

被引：37
|
作者：
FELD, H
ZURMUHLEN, R
LEUTE, A
BENNINGHOVEN, A
机构：
[1] Physikalisches Institut, Universität Münster, D-4400 Münster
来源：
JOURNAL OF PHYSICAL CHEMISTRY | 1990年 / 94卷 / 11期
关键词：
D O I：
10.1021/j100374a043
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Experiments have been performed to compare secondary ion emission from polymer substrates under kiloelectronvolt ion (secondary ion mass spectrometry, SIMS) and megaelectronvolt ion (plasma desorption mass spectrometry, PDMS) bombardment. The yield of carbon cluster ions has been determined for different polymers. A positive PDMS spectrum of poly(vinylidene fluoride) showing even-numbered carbon clusters to C200 is presented. The emission of these carbon cluster ions is explained by the strong degradation of the polymer under megaelectronvolt ion bombardment. This is discussed in comparison with the results in SIMS and laser mass spectrometry. © 1990 American Chemical Society.
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收藏
页码：4595 / 4599
页数：5
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