A SCANNING TUNNELING MICROSCOPY STUDY OF POLYCRYSTALLINE LEAD PHTHALOCYANINE THIN-FILMS

被引：12
|
作者：
PESTER, O
MRWA, A
HIETSCHOLD, M
机构：
[1] Department of Physics, University of Technology, Chemnitz
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1992年 / 131卷 / 01期
关键词：
D O I：
10.1002/pssa.2211310103
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The surface microstructures of lead phthalocyanine thin films are resolved by scanning tunneling microscopy (STM) in air. The data are compared with scanning electron microscopy (SEM) and infrared (IR) spectroscopy data. STM images show a substructure for the thicker (almost-equal-to 550 nm) lead phthalocyanine films.
引用
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页码：19 / 23
页数：5
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