EVALUATING RELIABILITY OF COMPLEX SYSTEMS WITH TIE-SET AND CUT-SET METHODS

被引：0

作者：

NAPOLITANO, LG

MURINO, P

DERUBERT.T

机构：

来源：

ELETTROTECNICA | 1972年 / 59卷 / 07期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：784 / +

页数：1

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