TEXTURE FEATURE-EXTRACTION

被引：27

作者：

HE, DC

WANG, L

GUIBERT, J

机构：

[1] DEMIRM OBSERV,CNRS,UA 336,F-92190 MEUDON,FRANCE

[2] ECOLE NORMALE SUPER,GEOG LAB,F-92120 MONTROUGE,FRANCE

来源：

PATTERN RECOGNITION LETTERS | 1987年 / 6卷 / 04期

关键词：

D O I：

10.1016/0167-8655(87)90087-0

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

引用

页码：269 / 273

页数：5

共 50 条

[1] FEATURE-EXTRACTION FOR TEXTURE CLASSIFICATION
WECHSLER, H
CITRON, T
[J]. PATTERN RECOGNITION, 1980, 12 (05) : 301 - 311
[2] DECORRELATION METHODS OF TEXTURE FEATURE-EXTRACTION
FAUGERAS, OD
PRATT, WK
[J]. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1980, 2 (04) : 323 - 332
[3] MULTIRESOLUTION FEATURE-EXTRACTION AND SELECTION FOR TEXTURE SEGMENTATION
UNSER, M
EDEN, M
[J]. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1989, 11 (07) : 717 - 728
[4] A REVIEW OF RECENT TEXTURE SEGMENTATION AND FEATURE-EXTRACTION TECHNIQUES
REED, TR
DUBUF, JMH
[J]. CVGIP-IMAGE UNDERSTANDING, 1993, 57 (03): : 359 - 372
[5] A novel feature-extraction algorithm for efficient classification of texture images
[J]. 1600, (75):
[6] A NOVEL FEATURE-EXTRACTION ALGORITHM FOR EFFICIENT CLASSIFICATION OF TEXTURE IMAGES
Mironica, Ionut
Dogaru, Radu
[J]. UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN SERIES C-ELECTRICAL ENGINEERING AND COMPUTER SCIENCE, 2013, 75 (02): : 101 - 114
[7] SYSTEMATIC FEATURE-EXTRACTION
BRAKKE, KA
MANTOCK, JM
FUKUNAGA, K
[J]. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1982, 4 (03) : 291 - 297
[8] MODIFICATION OF STRATEGIES IN FEATURE-EXTRACTION
SENDLMEIER, WF
[J]. CLINICAL LINGUISTICS & PHONETICS, 1990, 4 (03) : 239 - 245
[9] FEATURE-EXTRACTION IN FUTURE DETECTORS
BOCK, RK
ERMOLIN, Y
KRISCHER, W
LJUSLIN, C
LONE, S
ZOGRAFOS, K
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1990, 289 (03): : 534 - 538
[10] CURVILINEAR FEATURE-EXTRACTION AND APPROXIMATIONS
SUK, M
SULL, S
[J]. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 397 : 118 - 124

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