CHARACTERIZATION OF ORIENTATION IN THIN-LAYERS AT SOLID-LIQUID INTERFACES BY ATR SPECTROSCOPY

被引:3
|
作者
SWART, JMF
VANWOERKOM, PCM
机构
[1] Akzo Research Laboratories Arnhem, Corporate Research, Analytical and Environmental Chemistry Department, Arnhem, 6800 SB
关键词
D O I
10.1016/0022-2860(93)80074-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Orientation in thin multilayers on ATR crystals can be determined quantitatively only, if both thickness and optical constants (including frequency dependence!!) of these layers are known. Knowledge of these parameters combined with rigorous mathematical calculations based on the Fresnel equations offers a sound basis for evaluation of experimental dichroic ratios.
引用
收藏
页码:307 / 310
页数:4
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