RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES

被引：0

作者：

GROVENOR, CRM

CEREZO, A

SASSEN, J

LIDDLE, JA

HETHERINGTON, M

MACKENZIE, RAD

SHOLLOCK, BA

SMITH, GDW

机构：

来源：

INSTITUTE OF PHYSICS CONFERENCE SERIES | 1990年 / 98期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The Atom Probe Group in Oxford has in the past few years developed new microanalysis techniques for the detailed study of composition variations in materials with ultrafine microstructures. This paper will give several examples of the use of these novel techniques in the analysis of a wide range of metallic and semiconducting materials.

引用

页码：147 / 152

页数：6

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