INVESTIGATION OF THE CRITICAL STATE OF SPUTTERED YBA2CU3O7-X THIN-FILMS USING A HALL PROBE

被引:8
|
作者
RAUCH, W [1 ]
BEHNER, H [1 ]
GORNIK, E [1 ]
机构
[1] SIEMENS AG,CORP RES & DEV,W-8520 ERLANGEN,GERMANY
来源
PHYSICA C | 1992年 / 201卷 / 1-2期
关键词
D O I
10.1016/0921-4534(92)90124-U
中图分类号
O59 [应用物理学];
学科分类号
摘要
The critical state of DC-magnetron sputtered YBa2Cu3O7-x (YBCO) thin films with critical temperatures of 90 K and critical current densities well beyond 10(6) A/cm2 was investigated after magnetization with a magnetic field of 0.14 T. The sample surface of the square-shaped YBCO films was scanned using a Hall probe and the remanent axial magnetic field in the critical state was measured at a distance of z=0.5 mm above the sample. A comparison with theoretical calculations of the axial magnetic field resulted in a good qualitative agreement of experiment and calculation. This indicates that the samples were homogeneous. Additionally, a mapping of the critical state yields a more reliable j(c)-value compared to a single local measurement without any information about the homogeneity of the sample.
引用
收藏
页码:197 / 201
页数:5
相关论文
共 50 条
  • [1] MICROSTRUCTURAL DEPENDENCE OF SPUTTERED YBA2CU3O7-X THIN-FILMS ON DEPOSITION PARAMETERS
    BHATT, D
    BASU, SN
    WESTERHEIM, AC
    ANDERSON, AC
    PHYSICA C, 1994, 222 (3-4): : 283 - 296
  • [2] SUPERCONDUCTING AND STRUCTURAL-PROPERTIES OF SPUTTERED THIN-FILMS OF YBA2CU3O7-X
    MAKOUS, JL
    MARITATO, L
    FALCO, CM
    CRONIN, JP
    RAJENDRAN, GP
    UHLMANN, EV
    UHLMANN, DR
    APPLIED PHYSICS LETTERS, 1987, 51 (25) : 2164 - 2166
  • [3] THE STRUCTURAL CHARACTERIZATION OF DC SPUTTERED INSITU YBA2CU3O7-X THIN-FILMS
    GUILLOUXVIRY, M
    KARKUT, MG
    PERRIN, A
    SERGENT, M
    MATERIALS LETTERS, 1990, 10 (03) : 126 - 132
  • [4] THE HALL-COEFFICIENT OF YBA2CU3O7-X THIN-FILMS WITH (100) ORIENTATION
    LU, Y
    ZHAO, BR
    YUAN, CW
    ZHANG, YZ
    ZHAO, YY
    WANG, HS
    SHI, YH
    XU, P
    LI, L
    ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1989, 74 (03): : 283 - 287
  • [5] MICROSTRUCTURE OF EPITAXIAL YBA2CU3O7-X THIN-FILMS
    NIEH, CW
    ANTHONY, L
    JOSEFOWICZ, JY
    KRAJENBRINK, FG
    APPLIED PHYSICS LETTERS, 1990, 56 (21) : 2138 - 2140
  • [6] ELECTROMIGRATION FAILURE IN YBA2CU3O7-X THIN-FILMS
    VITTA, S
    STAN, MA
    WARNER, JD
    ALTEROVITZ, SA
    APPLIED PHYSICS LETTERS, 1991, 58 (07) : 759 - 761
  • [7] ANNEALING STUDIES OF YBA2CU3O7-X THIN-FILMS
    SHAH, SI
    APPLIED PHYSICS LETTERS, 1988, 53 (07) : 612 - 614
  • [8] RES INVESTIGATIONS ON YBA2CU3O7-X THIN-FILMS
    QUAN, Z
    SCHURIG, T
    MENKEL, S
    KNAPPE, S
    BEYER, J
    KOCH, H
    PHYSICA C, 1995, 249 (3-4): : 309 - 318
  • [9] FLUX PINNING IN THIN-FILMS OF YBA2CU3O7-X
    WORDENWEBER, R
    SCHNEIDER, J
    ABDELHAMED, MO
    PHYSICA B-CONDENSED MATTER, 1991, 169 (1-4) : 667 - 668
  • [10] SUPERCONDUCTIVITY AND RESPUTTERING EFFECTS IN RF-SPUTTERED YBA2CU3O7-X THIN-FILMS
    SHAH, SI
    CARCIA, PF
    APPLIED PHYSICS LETTERS, 1987, 51 (25) : 2146 - 2148