STUDY OF SHORT PERIODS OF OXIDATION BY TRANSMISSION ELECTRON-MICROSCOPY

被引:0
|
作者
ARMANET, F [1 ]
VEJUX, A [1 ]
BERANGER, G [1 ]
机构
[1] UNIV TECHNOL COMPIEGNE,DIV MAT,SERV ANALYSE PHYSICO CHIM,F-60206 COMPIEGNE,FRANCE
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:A26 / A26
页数:1
相关论文
共 50 条
  • [1] THE STUDY OF HIGH-TEMPERATURE OXIDATION BY TRANSMISSION ELECTRON-MICROSCOPY
    BUTLER, EP
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1983, 130 (JUN): : 263 - 277
  • [2] TRANSMISSION ELECTRON-MICROSCOPY STUDIES ON THE OXIDATION OF ALUMINUM
    SHINOHARA, K
    SEO, T
    KYOGOKU, H
    [J]. ZEITSCHRIFT FUR METALLKUNDE, 1982, 73 (12): : 774 - 780
  • [3] A TRANSMISSION ELECTRON-MICROSCOPY STUDY OF CRISTOBALITE
    WITHERS, RL
    WELBERRY, TR
    HUA, GL
    THOMPSON, JG
    HYDE, BG
    [J]. PHASE TRANSITIONS, 1989, 16 : 41 - 45
  • [4] STUDY BY SCANNING AND TRANSMISSION ELECTRON-MICROSCOPY
    LEDERER, P
    STOLTE, M
    TULUSAN, H
    [J]. VIRCHOWS ARCHIV A-PATHOLOGICAL ANATOMY AND HISTOPATHOLOGY, 1976, 372 (02) : 109 - 121
  • [5] STUDY OF MICROCIRCUITS BY TRANSMISSION ELECTRON-MICROSCOPY
    HAM, WE
    ABRAHAMS, MS
    BLANC, J
    BUIOCCHI, CJ
    [J]. RCA REVIEW, 1977, 38 (03): : 351 - &
  • [6] TRANSMISSION ELECTRON-MICROSCOPY OF SUBSOLIDUS OXIDATION AND WEATHERING OF OLIVINE
    BANFIELD, JF
    VEBLEN, DR
    JONES, BF
    [J]. CONTRIBUTIONS TO MINERALOGY AND PETROLOGY, 1990, 106 (01) : 110 - 123
  • [7] TRANSMISSION ELECTRON-MICROSCOPY AND PHOTOEMISSION ELECTRON-MICROSCOPY OF STEELS
    EDMONDS, DV
    [J]. MICROSCOPE, 1979, 27 (3-4): : 162 - 162
  • [8] OXIDATION OF ALUMINIZED COATINGS ON RENE-80, A TRANSMISSION ELECTRON-MICROSCOPY STUDY
    TSAI, MJ
    SHEN, P
    [J]. MATERIALS SCIENCE AND ENGINEERING, 1986, 83 (01): : 135 - 144
  • [9] STUDY BY TRANSMISSION ELECTRON-MICROSCOPY OF OXIDATION OF ZINC SUBSTITUTED MAGNETITE IN DEFECTIVE SPINEL
    GILLOT, B
    BENLOUCIF, RM
    MUTIN, JC
    ROUSSET, A
    [J]. COMPTES RENDUS DE L ACADEMIE DES SCIENCES SERIE II, 1983, 296 (19): : 1505 - 1508
  • [10] A SCANNING ELECTRON-MICROSCOPY TRANSMISSION ELECTRON-MICROSCOPY STUDY OF THE PHOTOCRYSTALLIZATION OF AMORPHOUS-SILICON
    PRASAD, A
    EBIHARA, K
    JOHN, PK
    TONG, BY
    WONG, SK
    CHIK, KP
    [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (10) : 5760 - 5763