THE THICKNESS DEPENDENCE OF THE X-RAY DIFFUSE-SCATTERING INTENSITY FOR CRYSTALS WITH MICRODEFECTS AT LAUE-CASE DIFFRACTION

被引：14

|

作者：

KOCHELAB, VV

MOLODKIN, VB

OLIKHOVSKII, SI

OSINOVSKII, ME

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1988年 / 108卷 / 01期

关键词：

D O I：

10.1002/pssa.2211080103

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

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页码：67 / 79

页数：13

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