A LOW-COST REFLECTANCE FT-IR MICROSCOPE

被引:4
|
作者
JANSEN, JAJ
VANDERMAAS, JH
DEBOER, AP
机构
[1] STATE UNIV UTRECHT,DEPT ANALYT MOLECULE SPECTROMETRY,UTRECHT,NETHERLANDS
[2] DELFT UNIV TECHNOL,DEPT POLYMERS,DELFT,NETHERLANDS
关键词
INFRARED; MICROSCOPY; LOW-COST ACCESSORY; REFLECTANCE SPECTROSCOPY; POLYMERS;
D O I
10.1366/0003702914336002
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A Fourier transform infrared spectroscopy (FT-IR) microscope combines microscopy with infrared (IR) spectroscopic molecuar characterization. IR microspectroscopy presents a well-established and useful analytical tool, though at relatively high cost. A low-cost reflectance FT-IR microscope has been developed. The configuration consists of a diffuse reflectance cell, extended to include a diaphragm, a monocular, and an x-y-z stage in combination with an FT-IR spectrometer. The experimental setup is presented in detail. The assembly attains a spot size of 0.3 mm and detection limits in the nanogram range. The potentialities and applications of the low-cost reflectance FT-IR microscope are demonstrated by various examples in the field of polymeric material and product characterization.
引用
收藏
页码:1149 / 1152
页数:4
相关论文
共 50 条
  • [1] THE USE OF A SMALL, LOW-COST FT-IR SPECTROMETER AS A MOBILE ANALYZER FOR FLUID STREAMS
    COMPTON, DAC
    MARKELOV, M
    MITTLEMAN, ML
    GRASSELLI, JG
    APPLIED SPECTROSCOPY, 1985, 39 (06) : 909 - 915
  • [2] REFLECTION SPECTROSCOPY WITH THE FT-IR MICROSCOPE
    WIHLBORG, WT
    REFFNER, JA
    STRAND, SW
    WASACZ, FM
    7TH INTERNATIONAL CONFERENCE ON FOURIER TRANSFORM SPECTROSCOPY, 1989, 1145 : 305 - 306
  • [3] MOLECULAR MICROSPECTRAL MAPPING WITH THE FT-IR MICROSCOPE
    REFFNER, JA
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1990, (98): : 559 - 569
  • [4] DIFFUSE REFLECTANCE FT-IR OF MINERAL SAMPLES.
    Carter, Janet
    Analitika Johannesburg, 1984, : 6 - 7
  • [5] CHARACTERIZATION OF AEROSOL ORGANICS BY DIFFUSE REFLECTANCE FT-IR
    GORDON, RJ
    TRIVEDI, NJ
    SINGH, BP
    ELLIS, EC
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1988, 196 : 145 - ENVR
  • [6] DIFFUSE REFLECTANCE FT-IR OF SURFACE MODIFIED KEVLAR
    BENRASHID, R
    TESORO, G
    MCKENZIE, MT
    7TH INTERNATIONAL CONFERENCE ON FOURIER TRANSFORM SPECTROSCOPY, 1989, 1145 : 467 - 468
  • [7] Integrated FT-IR and Raman imaging on the same microscope
    Adar, Fran
    Whitley, Andrew
    Lee, Eunah
    LeBourdon, Gwen
    SPECTROSCOPY, 2008, : 27 - 30
  • [8] CHARACTERIZATION OF PEAT SAMPLES BY DIFFUSE REFLECTANCE FT-IR SPECTROSCOPY
    HOLMGREN, A
    NORDEN, B
    APPLIED SPECTROSCOPY, 1988, 42 (02) : 255 - 262
  • [9] DIFFUSE REFLECTANCE FT-IR SPECTRA OF CONDUCTING POLYMERIC FILMS
    PATE, CB
    NOFTLE, RE
    SYNTHETIC METALS, 1990, 38 (02) : 259 - 261
  • [10] APPLICATIONS OF TRANSMITTANCE AND REFLECTANCE MICRO FT-IR TO POLYMERIC MATERIALS
    HARTHCOCK, MA
    LENTZ, LA
    DAVIS, BL
    KRISHNAN, K
    APPLIED SPECTROSCOPY, 1986, 40 (02) : 210 - 214