A SCANNING TUNNELING MICROSCOPE STUDY OF THE SI(110) SURFACE

被引:44
|
作者
HOEVEN, AJ
DIJKKAMP, D
VANLOENEN, EJ
VANHOOFT, PJGM
机构
关键词
D O I
10.1016/0039-6028(89)90767-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:165 / 172
页数:8
相关论文
共 50 条
  • [1] Scanning tunneling microscope of the ''16x2'' reconstructed Si(110) surface
    Packard, WE
    Dow, JD
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 81 (02) : 994 - 996
  • [2] Scanning tunneling microscopy study of silicide structure on Si(110) surface
    Ono, I
    Yoshimura, M
    Ueda, K
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (12B): : 7155 - 7157
  • [3] Scanning Tunneling Microscopy Study of In situ Hydrogenation of Si(110) Surface
    Visikovskiy, Anton
    Yoshimura, Masamichi
    Ueda, Kazuyuki
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, 49 (08)
  • [4] SCANNING TUNNELING MICROSCOPE IMAGES OF NATIVE DEFECTS ON THE ZNSE(110) SURFACE
    HU, WM
    DOW, JD
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (04): : 907 - 909
  • [5] THE RECONSTRUCTION OF THE SI(113) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPE
    ARABCZYK, W
    HINRICH, S
    MUSSIG, HJ
    [J]. VACUUM, 1995, 46 (5-6) : 473 - 476
  • [6] THE SCANNING TUNNELING MICROSCOPE AS A TOOL FOR NANOLITHOGRAPHY - WRITING NANOSTRUCTURES ON SI(110) IN AIR
    URBAN, J
    BRAUER, S
    MCKINNON, AW
    HORN, J
    HJORT, K
    PAGNIA, H
    KOOPS, HWP
    HARTNAGEL, HL
    [J]. MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) : 113 - 116
  • [7] SCANNING TUNNELING MICROSCOPY STUDY OF THE 16-STRUCTURE APPEARING ON A SI(110) SURFACE
    YAMAMOTO, Y
    KITAMURA, S
    IWATSUKI, M
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (5B): : L635 - L637
  • [8] SPECTROSCOPY OF METAL ADSORBATES ON THE GAAS(110) SURFACE STUDIED WITH THE SCANNING TUNNELING MICROSCOPE
    FEENSTRA, RM
    MARTENSSON, P
    LUDEKE, R
    [J]. CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS, 1989, 138 : 305 - 314
  • [9] Property change of Si(111) surface by scanning tunneling microscope manipulation
    Heike, S
    Hashizume, T
    Watanabe, S
    Lutwyche, MI
    Wada, Y
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1996, 35 (10B): : L1367 - L1370
  • [10] Scanning tunneling microscope controlled diffusion on Ag(110)
    Schulz, JJ
    Koch, R
    [J]. CHEMICAL PHYSICS LETTERS, 2000, 331 (2-4) : 119 - 124