METHODS FOR IMPROVING SIGNAL-TO-NOISE RATIO OF PHOTON AND ELECTRON BEAM ACCESSED MAGNETIC-FILM MEMORY SYSTEMS

被引:4
|
作者
SMITH, DO
机构
关键词
D O I
10.1109/TMAG.1968.1066371
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:634 / +
页数:1
相关论文
共 30 条
  • [5] Improving signal-to-noise ratio of structured light microscopy based on photon reassignment
    Singh, Vijay Raj
    Choi, Heejin
    Yew, Elijah Y. S.
    Bhattacharya, Dipanjan
    Yuan, Luo
    Sheppard, Colin J. R.
    Rajapakse, Jagath C.
    Barbastathis, George
    So, Peter T. C.
    BIOMEDICAL OPTICS EXPRESS, 2012, 3 (01): : 206 - 214
  • [6] TECHNIQUE FOR IMPROVING SIGNAL-TO-NOISE RATIO OF ELECTRON MULTIPLIERS IN MASS SPECTROMETERS
    YOUNG, JR
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (10): : 1414 - &
  • [7] PULSE OVERLAP EFFECTS ON LINEARITY AND SIGNAL-TO-NOISE RATIO IN PHOTON COUNTING SYSTEMS
    INGLE, JD
    CROUCH, SR
    ANALYTICAL CHEMISTRY, 1972, 44 (04) : 777 - +
  • [8] Wavelet-based methods for improving signal-to-noise ratio in phase images
    Cruz-Enriquez, H
    Lorenzo-Ginori, JV
    IMAGE ANALYSIS AND RECOGNITION, 2005, 3656 : 247 - 254
  • [9] Signal-to-noise ratio, contrast-to-noise ratio, and exposure time for imaging systems with photon-limited noise
    Lucke, Robert L.
    Kessel, Robert A.
    OPTICAL ENGINEERING, 2006, 45 (05)
  • [10] SIGNAL-TO-NOISE RATIO IMPROVEMENT IN ELECTRON-BEAM TESTING BY USING A DISPERSIVE ANALYZER
    DUBBELDAM, L
    KRUIT, P
    SCANNING MICROSCOPY, 1987, 1 (04) : 1647 - 1650