FAST-ION-BEAM LASER SPECTROSCOPY OF THE B-2-SIGMA(+)-X(2)SIGMA(+) AND B-2-SIGMA(+)-A(2)PI SYSTEMS OF SIO+ - EXPERIMENT

被引：18
|
作者：
CAMERON, R
SCHOLL, TJ
ZHANG, L
HOLT, RA
ROSNER, SD
机构：
[1] Department of Physics, University of Western Ontario, London, ON
来源：
JOURNAL OF MOLECULAR SPECTROSCOPY | 1995年 / 169卷 / 02期
关键词：
D O I：
10.1006/jmsp.1995.1029
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
We have used the frequency-doubled output of a cw Ti:sapphire laser to observe the spectrum of an 8-keV SiO+ beam in the region 368-386 nm. Almost 1400 lines of the (0, 0), (1, 0), (1, 1), (2, 1), (2, 2), (3, 2), and (3, 3) bands of the B-2 Sigma(+)-X(2) Sigma(+) system have been measured, most for the first time. In addition we have made the first observation of the B-2 Sigma(+)-A(2)II system, measuring 66 lines of the (2, 0) Omega = 1/2 sub-band. The I-2 absorption spectrum was used as the absolute wavenumber reference. (C) 1995 Academic Press, Inc.
引用
收藏
页码：352 / 363
页数：12
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