A STATISTICAL TECHNIQUE FOR CHARACTERIZING X-RAY POSITION-SENSITIVE DETECTORS

被引：19
|
作者：
DUFRESNE, E
BRUNING, R
SUTTON, M
RODRICKS, B
STEPHENSON, GB
机构：
[1] ARGONNE NATL LAB,ADV PHOTON SOURCE,ARGONNE,IL 60439
[2] IBM CORP,DIV RES,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1995年 / 364卷 / 02期
基金：
加拿大自然科学与工程研究理事会;
关键词：
D O I：
10.1016/0168-9002(95)00335-5
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We present a technique for characterizing X-ray sensitive photodiode arrays and charge-coupled device (CCD) arrays. The technique uses simple statistical estimators (means, variances and correlation functions) to determine the response, noise, resolution and detective quantum efficiency of a position-sensitive detector. We apply this technique by characterizing a linear diode array and a CCD array exposed to direct illumination by X-rays. Correlations between neighboring pixels were important, and they are included in the calculation of the detective quantum efficiency and noise of the detector.
引用
收藏
页码：380 / 393
页数：14
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