AN ELECTRONIC SPECKLE PATTERN INTERFEROMETER FOR COMPLETE INPLANE DISPLACEMENT MEASUREMENT

被引：96
|
作者：
MOORE, AJ
TYRER, JR
机构：
[1] Dept. of Mech. Eng., Loughborough Univ. of Technol.
来源：
MEASUREMENT SCIENCE AND TECHNOLOGY | 1990年 / 1卷 / 10期
关键词：
D O I：
10.1088/0957-0233/1/10/006
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Measurement of plane-strain surface displacement with ESPI requires at least two in-plane illumination geometries. For static loading conditions it is acceptable to record these two interferograms sequentially. However, for time-dependent strain fields, it is necessary to use both illumination geometries simultaneously so that a recording is made with identical strain conditions existing for both. The authors describe a new interferometer that has been devised to measure two in-plane interferograms at the same time. The determination of the method of operation and experimental verification of the technique are given.
引用
收藏
页码：1024 / 1030
页数：7
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