EFFECT OF FAILURE KINETICS ON TIME-TO-FAILURE DISTRIBUTIONS

被引：0
|
作者：
STEWART, RG
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1969年 / ED16卷 / 04期
关键词：
D O I：
10.1109/T-ED.1969.16764
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：401 / &
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