RESONANT SCATTERING ASSISTED LIGHT-ELEMENT ANALYSIS

被引：3
|
作者：
ZIMMERMAN, RL [1 ]
ILA, D [1 ]
SMITH, CC [1 ]
机构：
[1] NASA,GEORGE C MARSHALL SPACE FLIGHT CTR,HUNTSVILLE,AL 35812
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1994年 / 85卷 / 1-4期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1016/0168-583X(94)95788-6
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The use of H+ beams at a selected low energy allows enhanced detection sensitivity to those atoms which possess resonant scattering. Further improvement is possible by using the simultaneous reduction of the substrate scattering cross section by destructive resonance interference. To show the usefulness of destructive and constructive resonance interference, we have selected two systems: one is a thin film of carbon on a silicon substrate and the other is boron on a carbon substrate.
引用
收藏
页码：68 / 70
页数：3
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