THERMAL FORMATION OF SIO2 ON MONOCRYSTALLINE SILICON

被引：0
|
作者：
VELASCO, G
PEREZDEL.R
机构：
来源：
ANALES DE FISICA | 1970年 / 66卷 / 11-1期
关键词：
D O I：
暂无
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：385 / +
页数：1
相关论文
共 50 条
  • [1] DEFECT CHARACTERIZATION IN MONOCRYSTALLINE SILICON GROWN OVER SIO2
    MCGINN, JT
    JASTRZEBSKI, L
    CORBOY, JF
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (02) : 398 - 403
  • [2] DEFECT CHARACTERIZATION IN MONOCRYSTALLINE SILICON GROWN OVER SIO2
    MCGINN, JT
    JASTRZEBSKI, LL
    CORBOY, JF
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (03) : C100 - C100
  • [3] THICK-FILMS OF MONOCRYSTALLINE SILICON ON SIO2 OBTAINED VIA EMBEDDING SIO2 STRIPES IN BULK SILICON
    DUTARTRE, D
    HAOND, M
    BENSAHEL, D
    [J]. MATERIALS LETTERS, 1985, 3 (12) : 489 - 492
  • [4] Nanowear behaviour of monocrystalline silicon against SiO2 tip in water
    Wang, X. D.
    Song, C. F.
    Yu, B. J.
    Chen, L.
    Qian, L. M.
    [J]. WEAR, 2013, 298 : 80 - 86
  • [5] Threshold contact pressure for the material removal on monocrystalline silicon by SiO2 microsphere
    Xiao, Chen
    Chen, Cheng
    Guo, Jian
    Zhang, Peng
    Chen, Lei
    Qian, Linmao
    [J]. WEAR, 2017, 376 : 188 - 193
  • [6] Nanofretting Behavior of Monocrystalline Silicon (100) Against SiO2 Microsphere in Vacuum
    Jiaxin Yu
    Linmao Qian
    Bingjun Yu
    Zhongrong Zhou
    [J]. Tribology Letters, 2009, 34
  • [7] Nanofretting Behavior of Monocrystalline Silicon (100) Against SiO2 Microsphere in Vacuum
    Yu, Jiaxin
    Qian, Linmao
    Yu, Bingjun
    Zhou, Zhongrong
    [J]. TRIBOLOGY LETTERS, 2009, 34 (01) : 31 - 40
  • [8] Reprint of Nanowear behaviour of monocrystalline silicon against SiO2 tip in water
    Wang, X. D.
    Song, C. F.
    Yu, B. J.
    Chen, L.
    Qian, L. M.
    [J]. WEAR, 2013, 301 (1-2) : 795 - 801
  • [9] Silicon nanoparticles formation in annealed SiO/SiO2 multilayers
    Kovacevic, I.
    Dubcek, P.
    Duguay, S.
    Zorc, H.
    Radic, N.
    Pivac, B.
    Slaoui, A.
    Bernstorff, S.
    [J]. PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2007, 38 (1-2): : 50 - 53
  • [10] Antirefiection effect of SiO2 thin film on the pyramidal textured surface of monocrystalline silicon
    Cao, Han
    Bai, Yang
    Qiao, Lijie
    [J]. OPTIK, 2015, 126 (20): : 2643 - 2645
12345