INVESTIGATION OF DEFECTS IN WEAKLY DAMAGED ION-IMPLANTED GAAS-LAYERS

被引:21
|
作者
WESCH, W
JORDANOV, A
GARTNER, K
GOTZ, G
机构
关键词
D O I
10.1016/0168-583X(89)90822-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:445 / 448
页数:4
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