PROPERTIES OF DX CENTERS IN ALXGA1-XAS CO-DOPED WITH BORON AND SILICON

被引:7
|
作者
MOONEY, PM
TISCHLER, MA
PARKER, BD
机构
关键词
D O I
10.1063/1.105873
中图分类号
O59 [应用物理学];
学科分类号
摘要
AlxGa1-xAs co-doped with Si and B was investigated to determine the effect of B on the properties of DX centers. We found the deep level transient spectroscopy (DLTS) peak of the DX center to be unchanged and also observed large persistent photoconductivity (PPC), in samples containing boron in concentrations up to 6 X 10(18) cm-3. Our finding that B has no significant effect on DX centers differs from an earlier report that the presence of low concentrations of B modified the DLTS spectrum of Si-doped GaAs under hydrostatic pressure.
引用
收藏
页码:2829 / 2831
页数:3
相关论文
共 50 条
  • [1] Photoexcited states of DX centers in Si doped AlxGa1-xAs
    Jia, YB
    Grimmeiss, HG
    JOURNAL OF APPLIED PHYSICS, 1996, 80 (06) : 3493 - 3503
  • [2] STABILITY OF DX CENTERS IN ALXGA1-XAS ALLOYS
    ZHANG, SB
    CHADI, DJ
    PHYSICAL REVIEW B, 1990, 42 (11): : 7174 - 7177
  • [3] ELECTRICAL-PROPERTIES OF DX CENTERS IN HEAVILY SE-DOPED ALXGA1-XAS
    NOTARI, AC
    SCHRAPPE, BJ
    BASMAJI, P
    SOLID STATE COMMUNICATIONS, 1992, 81 (04) : 363 - 365
  • [5] TIME ANALYZED TRANSIENT SPECTROSCOPY AND MULTIPLE DX RELATED EMISSION CENTERS IN SILICON DOPED ALXGA1-XAS
    AGARWAL, S
    MOHAPATRA, YN
    SINGH, VA
    SHARAN, R
    JOURNAL OF APPLIED PHYSICS, 1995, 77 (11) : 5725 - 5729
  • [6] NONEXPONENTIAL PHOTOIONIZATION OF DX-CENTERS IN SI-DOPED ALXGA1-XAS
    SU, Z
    FARMER, JW
    PHYSICAL REVIEW B, 1992, 46 (15): : 9772 - 9775
  • [7] Detailed electrical characterization of DX centers in Se-doped AlxGa1-xAs
    Duenas, S
    Pinacho, R
    Castan, E
    Quintanilla, L
    Pelaez, R
    Barbolla, J
    JOURNAL OF APPLIED PHYSICS, 1997, 82 (09) : 4338 - 4345
  • [8] A MULTISTATE MODEL FOR DX CENTERS IN ALXGA1-XAS ALLOY
    KANG, JY
    HUANG, QS
    JOURNAL OF LUMINESCENCE, 1988, 40-1 : 365 - 366
  • [9] Fine structure of DX(Sn) centers in AlxGa1-xAs
    Zhan, HH
    Kang, JY
    Wu, ZY
    Huang, QS
    JOURNAL OF APPLIED PHYSICS, 1998, 84 (05) : 2497 - 2500
  • [10] ODMR INVESTIGATIONS OF DX CENTERS IN SN-DOPED AND SI-DOPED ALXGA1-XAS
    FOCKELE, M
    SPAETH, JM
    OVERHOF, H
    GIBART, P
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1991, 6 (10B) : B88 - B91