ON ANGLE RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY OF OXIDES, SERRATIONS, AND PROTUSIONS AT INTERFACES

被引：36

作者：

DARLINSKI, A ^{[1
]}

HALBRITTER, J ^{[1
]}

机构：

[1] KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH,INST KERNPHYS 2,D-7500 KARLSRUHE 1,FED REP GER

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.574779

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1235 / 1240

页数：6

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