MULTISPECTRAL SOLAR TELESCOPE ARRAY .2. SOFT-X-RAY EUV REFLECTIVITY OF THE MULTILAYER MIRRORS

被引：0
|
作者：
BARBEE, TW
WEED, JW
HOOVER, RB
ALLEN, MJ
LINDBLOM, JF
ONEAL, RH
KANKELBORG, CC
DEFOREST, CE
PARIS, ES
WALKER, ABC
WILLIS, TD
GLUSKIN, E
PIANETTA, P
BAKER, PC
机构：
[1] NASA,GEORGE C MARSHALL SPACE FLIGHT CTR,CTR SPACE SCI,HUNTSVILLE,AL 35812
[2] STANFORD UNIV,CTR SPACE SCI & ASTROPHYS,STANFORD,CA 94305
[3] ARGONNE NATL LAB,ARGONNE,IL 60439
[4] STANFORD UNIV,STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94305
[5] BAKER CONSULTING,WALNUT CREEK,CA 94596
来源：
OPTICAL ENGINEERING | 1991年 / 30卷 / 08期
关键词：
X-RAY EUV OPTICS; MULTILAYER MIRRORS; X-RAY TELESCOPES; NORMAL INCIDENCE X-RAY OPTICS; TELESCOPE CALIBRATION;
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We have developed seven compact soft x-ray/EUV (XUV) multilayer-coated and two compact FUV interference-film-coated Cassegrain and Ritchey-Chretien telescopes for a rocket-borne observatory, the Multi-Spectral Solar Telescope Array. We report here on extensive measurements of the efficiency and spectral bandpass of the XUV telescopes carried out at the Stanford Synchrotron Radiation Laboratory.
引用
收藏
页码：1067 / 1075
页数：9
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