MEASUREMENT OF FERRITE PARAMETERS AT MICROWAVE FREQUENCIES

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作者：

SCHOTT, FW

TAO, TF

机构：

来源：

ELECTRONICS LETTERS | 1969年 / 5卷 / 05期

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D O I：

10.1049/el:19690060

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：84 / &

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